Conducting AFM and 2D GIXD studies on pentacene thin films.

نویسندگان

  • Hoichang Yang
  • Tae Joo Shin
  • Mang-Mang Ling
  • Kilwon Cho
  • Chang Y Ryu
  • Zhenan Bao
چکیده

Among all organic semiconductors, pentacene has been shown to have the highest thin film mobility reported to date. The crystalline structure of the first few pentacene layers deposited on a dielectric substrate is strongly dependent on the dielectric surface properties, directly affecting the charge mobility of pentacene thin film OTFTs. Herein, we report that there is a direct correlation between the crystalline structure of the initial submonolayer of a pentacene film and the mobility of the corresponding 60-nm-thick films showing terrace-like structure, as confirmed by 2D grazing-incidence X-ray diffraction and atomic force microscopy. Specifically, multilayered pentacene films, grown from single crystal-like faceted islands on HMDS-treated surface, have shown much higher charge mobility (mu = 3.4 +/- 0.5 cm2/Vs) than those with polycrystalline dendritic islands (mu = 0.5 +/- 0.15 cm2/Vs) on OTS-treated ones.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Effects of pentacene-doped PEDOT:PSS as a hole-conducting layer on the performance characteristics of polymer photovoltaic cells

We have investigated the effect of pentacene-doped poly(3,4-ethylenedioxythiophene:poly(4-styrenesulfonate) [PEDOT:PSS] films as a hole-conducting layer on the performance of polymer photovoltaic cells. By increasing the amount of pentacene and the annealing temperature of pentacene-doped PEDOT:PSS layer, the changes of performance characteristics were evaluated. Pentacene-doped PEDOT:PSS thin ...

متن کامل

Synthesis and Structural Studies of Nickel ‎Doped Cobalt Ferrite Thin Films

   The growth and structural study of Nickel doped Cobalt ferrite thin films on glass substrate using spray pyrolysis technique have been done. The structural studies confirmed the growth of polycrystalline film having cubic structure with Fd3m space group. The x ray density was found to increase with Ni concentration, where as the reduction, in crystalline size, was found in XRD m...

متن کامل

Effect of Surface Energy on Pentacene Thin-Film Growth and Organic Thin Film Transistor Characteristics

In this study, we discuss pentacene-based organic thin films grown on a self-assembled monolayer (SAM)-treated dielectric with various functional groups and molecular lengths. The functional groups and molecular lengths on the dielectric surface were modified using a SAM treatment followed by ultra violet (UV) light exposure. Surface energy was used to observe the surface polarity variation dur...

متن کامل

Molecular structure of extended defects in monolayer-scale pentacene thin films

The growth of pentacene thin films for applications in thin-film transistors and other organic electronic devices results in a variety of extended structural defects including dislocations, grain boundaries, and stacking faults. We have used scanning tunneling microscopy STM to probe the molecular-scale structure of grain boundaries and stacking faults in a pentacene thin film on a Si 001 surfa...

متن کامل

Characterization and Microstructure of Titanium Dioxide Prepared by Radio Frequency Magnetron Sputtering

Titanium oxide (TiO2) thin films were deposited by RF magnetron sputtering on Si and glass substrates. The microstructure, surface morphology, and optical properties of the thin films were investigated by grazing incidence X-ray diffraction (GIXD), transmission electron microscopy (TEM), field emission scanning electron microscopy (FE-SEM), atomic force microscopy (AFM), and UV/VIS spectrophoto...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Journal of the American Chemical Society

دوره 127 33  شماره 

صفحات  -

تاریخ انتشار 2005